SemiSol Analytik GmbH
SemiSol Analytik GmbH

Applications

  • layer- and depth profiles
  • bulk analysis
  • microstructures
  • particles
  • surfaces
  • process components

Preparation techniques

  • VPD (surface analysis - each diameter and surface)
  • layer removals and layer analysis (up to 100µm)
  • bulk preparation
  • chemical extractions (incl. microwave)

Analysis methods

  • TXRF, ICP-MS, ICP-OES
  • SIMS, ToF-SIMS
  • NAA
  • EDX, WDX, XPS, AES
  • electron microscopy (REM, TEM)
  • Ion chromatography
  • photometry
  • FTIR infrared spectroscopy
  • thermo analysis TGA, SC
  • titration, determination of ph-values
  • ultrapure waterinspections

 

Further analysis methods on request!

ICP-MS analysis within

2 working days

 

TXRF analysis within

  1 working day

Office Dresden:

SemiSol Analytik GmbH

Maria-Reiche-Str. 1

D-01109 Dresden

Phone: +49 351/4076 3793

Fax:     +49 351/7979079

Email:   office@semisol.de

 

 

Office München:

SemiSol Analytik GmbH

Geretsriederstr. 10a

D-81379 München

Phone: +49 89/4516 9423

Fax:     +49 351/7979079

Email:  office@semisol.de



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